NordStruct Partner University: University of Helsinki
Country: Finland

The Electron Microscopy (EM) Unit provides advanced electron microscopy, specimen preparation, and image analysis services to support a wide range of research applications. The facility houses transmission electron microscopes (TEM), including the JEOL JEM-1400 and HITACHI HT7800, as well as scanning electron microscopy systems (SEM), such as the ZEISS Crossbeam 550 and ZEISS Gemini 460 with Volutome, enabling focused ion beam SEM (FIB-SEM), serial block-face SEM (SBF-SEM), and array tomography (AT). The unit also supports correlative light and electron microscopy (CLEM) through instruments such as the ZEISS Axio Vert and ZEISS Stemi 508. Its specimen preparation capabilities include standard TEM and SEM preparation techniques and ultrathin sectioning using a Leica EM UC6 ultramicrotome. In addition, the facility provides dedicated image processing workstations and expertise in image analysis, processing, and modeling of multidimensional datasets, offering technical guidance and support throughout research projects.

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Contact: 
embi-staff@helsinki.fi